Onyx - Electrical characterization of materials | das-Nano

The first system of its kind, Onyx delivers full-area, non-destructive electrical characterization of graphene, thin films, and other 2D materials.

Bridging the gap between macro and nanoscale tools, it enables measurements from 0.5 mm² to entire square meters , accelerating the transition from research to industrial application.

The Onyx system complies with IEC TS 62607-6-10:2021 , the technical specification established by the International Electrotechnical Commission (IEC) for measuring sheet resistance in graphene-based materials using terahertz time-domain spectroscopy.

Solutions Thickness Measurement Electrical Characterization Defect Detection

Thickness Measurement

Electrical Characterization

Defect Detection

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Terahertz waves

Experience the next era of material characterization today

Unlock new possibilities in analysis with terahertz precision

To bridge the gap between macroscale and nanoscale quality inspection systems

Onyx: Precision that drives material innovation

From R&D to production, Onyx’s adaptable technology is the go-to solution for industries pushing the boundaries of material science.

Onyx offers unparalleled material characterization across multiple industries. Whether you’re working with photovoltaics, semiconductors, smart materials, or advanced coatings, Onyx delivers precise, real-time insights that drive innovation and elevate performance.

Maximize the efficiency of thin-film coatings with advanced, non-destructive analysis.

Achieve accurate electrical property measurements to optimize semiconductor manufacturing.

Unlock the potential of dynamic materials with comprehensive, depth-related data.

Empower breakthrough research with high-precision electrical property insights.

Fine-tune components with Onyx’s advanced measurement capabilities.

Ensure consistent quality and high performance with accurate, fast, and non-invasive testing.

Unlike infrared radiation, which has limited penetration capabilities, our technology uses terahertz waves that can penetrate deeper into materials, providing a more thorough analysis.

Additionally, while microwaves offer good resolution for certain applications, our solution delivers significantly higher resolution, enabling more precise measurements at a sub-millimeter level.

This combination of greater penetration and superior resolution ensures a more comprehensive understanding of material properties, making it ideal for complex material characterization.