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NanoMOKE3 Wafer Mapper 晶圆映射克尔效应磁强计

NanoMOKE3

NanoMOKE3 Wafer Mapper 是为在整片晶圆范围内测量磁滞回线和磁畴图像而配置的超高灵敏度克尔效应磁强计。

品牌: Durham Magneto Optics价格: 面议服务区域: 全国

广西科米瑞实验仪器设备有限公司提供 Durham Magneto Optics NanoMOKE3 产品资料、选型咨询、供货报价和售后服务支持,价格面议。

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NanoMOKE3: an ultra-high sensitivity Kerr effect wafer mapping magnetometer
说明规格FAQ

说明

The NanoMOKE®3 Wafer Mapper is an ultrahigh sensitivity Kerr effect magnetometer specially configured for measuring magnetic hysteresis loops and domain images across the entire surface of large area samples. It is ideally suited for wafer-scale development and manufacture of MRAM, magnetic sensors and advanced materials.

Handles up to 330mm x 250mm wafers

Wafer stage travelling range of 204mm in X and 164mm in Y

Ultra-high sensitivity and stability

Very low noise

Highly focused laser spot

Video-rate microscope to allow precise positioning of laser spot on sample and domain imaging

3000 G applied field in x and y or z projected from beneath the wafer allowing free movement of wafer above electromagnet

Optional heating element to locally inject hot gas at the laser measurement point

Sensitive to Longitudinal, Transverse and Polar Kerr rotation and ellipticity

Obtains coercivity, remanence and exchange bias automatically from measured loops

Supplied with LX Pro, our easy to use and flexible control software

NanoMOKE3 wafer mapper

规格

型号或系列NanoMOKE3
Wafer handlingHandles up to 330mm x 250mm wafers
Wafer stage travelWafer stage travelling range of 204mm in X and 164mm in Y
Applied field3000 G applied field in x and y or z projected from beneath the wafer allowing free movement of wafer above electromagnet Optional heating element to locally inject hot gas at the laser measurement point Sensitive to Longitudinal, Transverse a
Control softwareSupplied with LX Pro, our easy to use and flexible control software NanoMOKE3 wafer mapper
规格书NanoMOKE3-wafer-mapping-specifications.pdf

FAQ

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NanoMOKE3: an ultra-high sensitivity Kerr effect magnetometer

NanoMOKE3 高灵敏度克尔效应磁强计

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