Spectra 300 (S)TEM

Spectra 300 (S)TEM

Aberration-corrected (S)TEM for high resolution and analytical power

The Thermo Scientific Spectra 300 Scanning Transmission Electron Microscope ((S)TEM) is a high-end aberration-corrected TEM platform engineered for maximum resolution, sensitivity, and analytical depth at the atomic scale. Designed for advanced research in nanotechnology, semiconductors, and quantum materials, the Spectra 300 (S)TEM delivers outstanding performance through cutting-edge electron optics, enhanced stability, and fully integrated spectroscopy solutions. With optimized workflows, high-speed data acquisition, and precise control of imaging conditions, it helps researchers confidently extract deeper insights from complex materials.

Key features of Spectra 300 (S)TEM

Exceptional resolution

Sub-angstrom imaging for atomic-scale visualization.

Advanced electron optics

Aberration correction and monochromation deliver outstanding image and spectroscopy quality.

Deep analytical capability

High-sensitivity EDS and EELS provide comprehensive chemical and electronic structure analysis.

Maximum stability

Designed for ultra-high-resolution performance with advanced environmental control.

High-end research support

Tailored for next-generation materials, quantum materials, and nanotechnology.

Advanced detectors

State-of-the-art detectors provide comprehensive elemental analysis and high-sensitivity imaging.

User-friendly interface

Thermo Scientific Velox Software provides an intuitive interface and automated functions.

Robust design

Acoustic enclosure minimizes outside interference. On-system display shows system status and aids sample insertion.

Innovative technology

Stay ahead of the curve with cutting-edge technology that pushes the boundaries of what’s possible in electron microscopy.

Enhanced productivity

Automated alignments and corrector tuning to help you concentrate on experiments rather than on instrument adjustments.

Comprehensive support

Backed by Thermo Fisher Scientific’s global network of experts and dedicated customer service.

Spectra 300 (S)TEM specifications

Energy spread: 0.2 to 0.3 eV

Information limit: 60 pm

STEM resolution: 136 pm

Probe corrector

Information limit: 100 pm

STEM resolution: 50 pm (125 pm @ 30 kV)

X-FEG/monochromator double corrected (probe+image corrector)

X-CFEG double-corrected (probe+image correction)

Energy spread: 0.4 eV

Information limit: 70 pm

STEM resolution: 50 pm (136 pm @ 30 kV)

X-FEG Mono: High-brightness Schottky field emitter gun and monochromator with a tunable energy resolution range between 1 eV and <0.2 eV

X-FEG UltiMono: High-brightness Schottky field emitter gun with ultra-stable monochromator and accelerating voltage with a tunable energy resolution range between 1 eV and <0.03 eV