Mad City Labs QS-PLL
QS-PLL
Mad City Labs QS-PLL, 原子力显微镜系统. 页面列出的重点包括: Lift mode scan for Nano-Magnetometry Integrated PLL and motion control Amplitude oscillation controllable to 1 nm Low noise atomic ste...
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产品说明: QS-PLL ® is an atomic force microscope (AFM) controller designed for use with resonant probes, such as tuning forks, and Mad City Labs nanopositioners and micropositioners. The controller integrates motion control and phase lock loop (PLL) control thus streamlining the hardware interface. Hardware and the digital PLL are controlled via the AFMView ® 2 software supplied with the QS-PLL ® controller. The QS-PLL ® controller allows users to customize a resonant probe AFM instrument with the unique feature of “Lift Mode” scans in addition to the usual scanning modes. This instrument is ideal for scanning probe microscopy where tip-surface interactions are modulated by a field, such as scanning NV magnetometry. The QS-PLL ® is compatible with all Mad City Labs closed loop nanopositioners and stepper motor driven micropositioners. Up to 3 axes of piezo nanopositioning
产品特点: Lift mode scan for Nano-Magnetometry Integrated PLL and motion control Amplitude oscillation controllable to 1 nm Low noise atomic step performance Software switch between force feedback and positiion feedback Automated software and hardware setup Compatible with Mad City Labs nanopositioners Compatible with Akyama type and QZabre probes Includes AFMView ® 2 software
典型应用: Scanning NV center Magnetometry Magnetic Force Microscopy Electric Force Microscopy Atomic Force Microscopy
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