Vue series
Vue series
Through-Transmission (except Mini Vue)。B-Scan Cross Section Images。C-Scan Planar Images
广西科米瑞实验仪器设备有限公司生产销售 PVA TePla Vue series，可提供产品参数、报价和售后服务咨询，价格面议。
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Volume Inspection
Scanning Modes
Through-Transmission (except Mini Vue)
A-Scan Waveforms
B-Scan Cross Section Images
C-Scan Planar Images
TOF - Time of Flight Images
THK - Thicknes Images
Vue series - Measurements
Frequency Domain
Max. Peak Amplitude
Pos. and Neg. Peak Amplitude
Time of Flight to Peaks & Edges
End-User Signal Processing
ODIS (OKOS Digital Imaging System) is the latest generation of acoustic microscopy software, developed on modern platforms and shaped by extensive industry feedback. It delivers powerful, data‑driven analysis through a comprehensive suite of quantitative tools for precise measurement, characterization, and classification of parts. Designed for advanced inspection environments, ODIS enables fast, reliable evaluation across a wide range of materials and applications.
Inspection & Analysis
Multi Zone Inspection (SALI) | C-Scans, B-Scans, A-Scan | Peak Amplitude & Time of Flight | Defect Detection | Thickness Measurement | Cluster Analysis | Histogram | Void Analysis | Quantification | Go/No-Go Classification
User Interface Modes: Advanced | Engineer | Operator
VUE 250-P
Vue 400-P
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