广西科米瑞实验仪器设备有限公司应用与技术支持
返回上一页
QS-PLL Mad City Labs QS-PLL
产品与应用图片。
实验室仪器

Mad City Labs QS-PLL

Mad City Labs

Mad City Labs QS-PLL, 原子力显微镜系统. 页面列出的重点包括: Lift mode scan for Nano-Magnetometry Integrated PLL and motion control Amplitude oscillation controllable to 1 nm Low noise atomic step performance Software switch between force feedback and positiion feedback Automated...

电话咨询这款仪器

微信扫码咨询

请发送仪器型号与应用需求,咨询选型及报价。

微信咨询二维码 13422079856
查看技术参数

根据您的样品与应用需求,咨询适用配置。

测量方法

产品概述与应用

产品说明: QS-PLL ® is an atomic force microscope (AFM) controller designed for use with resonant probes, such as tuning forks, and Mad City Labs nanopositioners and micropositioners. The controller integrates motion control and phase lock loop (PLL) control thus streamlining the hardware interface. Hardware and the digital PLL are controlled via the AFMView ® 2 software supplied with the QS-PLL ® controller. The QS-PLL ® controller allows users to customize a resonant probe AFM instrument with the unique feature of “Lift Mode” scans in addition to the usual scanning modes. This instrument is ideal for scanning probe microscopy where tip-surface interactions are modulated by a field, such as scanning NV magnetometry. The QS-PLL ® is compatible with all Mad City Labs closed loop nanopositioners and stepper motor driven micropositioners. Up to 3 axes of piezo nanopositioning

产品特点: Lift mode scan for Nano-Magnetometry Integrated PLL and motion control Amplitude oscillation controllable to 1 nm Low noise atomic step performance Software switch between force feedback and positiion feedback Automated software and hardware setup Compatible with Mad City Labs nanopositioners Compatible with Akyama type and QZabre probes Includes AFMView ® 2 software

典型应用: Scanning NV center Magnetometry Magnetic Force Microscopy Electric Force Microscopy Atomic Force Microscopy

技术概览

技术参数

型号QS-PLL
品牌Mad City Labs
产品特点Lift mode scan for Nano-Magnetometry Integrated PLL and motion control Amplitude oscillation controllable to 1 nm Low noise atomic step performance Software switch between force feedback and positiion feedback Automated software and hardware setup Co
典型应用Scanning NV center Magnetometry Magnetic Force Microscopy Electric Force Microscopy Atomic Force Microscopy
控制方式Closed loop control
应用咨询

咨询仪器选型与报价

提供产品名称、型号、数量和使用要求,我们将协助确认参数与配置。

联系科米瑞
Kemirui / 应用咨询

一起讨论您的测量需求。

您的信息用于处理本次咨询。