VEpioneer series

Thin Film Inspection

Full insight from your bench-top

Fully integrated, one-button bench-top Hyperspectral Vision system, ready to use out of the box

Non-destructive, full-surface (100%) inspection in a single run

Fast measurement in less than 10 seconds

Layer thickness detection from 1 nm to 500 µm, depending on layer material

Spatially resolved recognition of defects, contaminations, and surface properties

Compatible with a wide range of substrates: semiconductors, metals, polymers, ceramics, glass and more

Centralised control and evaluation via VEsolve ® pro software

VEpioneer macro

Compact bench-top system designed for macroscopic inspection

Accommodates sample sizes up to 360 × 360 mm

Spatial resolution of 100 - 300 µm with high-resolution scan modes available

Tailored sample stage and versatile customization options

VEpioneer micro

Bench-top system optimised for microscopic inspection

Achieves sub-micron spatial resolution depending on microscope lens

Handles sample sizes up to 130 × 130 mm

Flexible operation: manual control via joystick or fully automatic via software

VEpioneer core

The world's smallest fully integrated Hyperspectral Vision bench-top system

Ultra-compact footprint of only 230 × 200 mm at just 12 kg

Designed for sample sizes up to 100 × 100 mm

Delivers spatial resolution of 100 µm, ideal as an entry point into hyperspectral inspection