Wafer Surface Measurement System
Wafer Surface Measurement System
Vapor Phase Decomposition。Features at a glance。All media, from process chemicals to ICP-MS calibration, are supplied fully automatically by the system.
广西科米瑞实验仪器设备有限公司提供 PVA TePla Wafer Surface Measurement System 产品资料、选型咨询、供货报价和售后服务支持，价格面议。
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说明
Wafer Inspection
Vapor Phase Decomposition
Features at a glance
All media, from process chemicals to ICP-MS calibration, are supplied fully automatically by the system.
Fully automated rinsing and cleaning cycles.
Risks to personnel and products from contamination and operating errors are minimized.
Reduced personnel costs: The central host computer controls the entire system, enables remote operation or control via SECS/GEM of all components, and provides real-time results.
Interested in WSMS
规格
| Model / product family | Wafer Surface Measurement System |
|---|---|
| 产品类别 | Wafer Inspection / Vapor Phase Decomposition |
| Wafer sizes | 4" - 12" |
| Surfaces | Hydrophobic/hydrophilic/bevel/upper bevel |
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