显微镜、成像系统、光学平台与光学测量设备
材料表征、热分析、力学、粒度、表面和物性测试设备
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Scanning modes include Contact Mode, Dynamic Mode, LFM, MFM, f-d Spectroscopy, Piezo Response Force Microscopy, Kelvin Probe Force Microscopy, Conductive AFM...
The page lists ezSTM current range, scan range, resolution, imaging modes, spectroscopy, ultrasonic motor sample approach and camera options.
hpAFM is listed with alignment-free design, closed loop flexure scanner, decoupled z scanner and optical microscope.
APPCS is an advanced physical property characterization system with cryostat and main system configuration.
ezHEMS is listed for Hall Effect measurements with carrier concentration, mobility, current, resistivity, temperature range and magnetic field options.
HEMS & LT-AC/DC is listed with static insert, rotary insert, DC resistance/Hall Effect measurements and AC susceptibility measurement.
The page lists Vibrating Sample Magnetometer with high sensitivity, high measuring range, electromagnet field and cryostat combination field.
LT-AFM/MFM is listed with scan head options for ultra large, large and standard area operation at 300K, 77K and 4.2K.
LT-SHPM/STM is listed with scan head options for ultra large, large and standard scan areas at low temperatures.
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LT-sSNOM is listed as a low-temperature microscopy product with scan head options for ultra large, large and standard scan ranges.
NV-centre confocal microscopy is listed with 532 nm SLM 10 mW laser, scan area, APD optical detection and low-temperature nanopositioner/scanner configuration.
NMI cryostat is listed as cryogen-free ultra low vibration cryostat with magnetic field and temperature specifications.
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