LABORATORY INSTRUMENT SELECTION & SUPPLYApplication & Technical Support
KEMIRUI / INSTRUMENT CATALOG

Profile & roughness measurement

Browse by instrument type and brand. Review models and specifications, then discuss the configuration you need.

Profile & roughness measurementClear all
CXR-bgn 威尔 WALE CXR-bgn 轮廓仪

威尔 WALE CXR-bgn 轮廓仪

WALE / 威尔CXR-bgn

驱动器采用高精度一体式铸造工艺,整体一体成型、无缝拼接,从结构根源上强化机身刚性与运行稳定性,显著降低测量过程中的机身形变与振动干扰,为各类精密工件的高精度检测,筑牢坚实可靠的结构基础。

View specifications & applications
ITC-3200vf 威尔 WALE ITC-3200vf 双向轮廓仪

威尔 WALE ITC-3200vf 双向轮廓仪

WALE / 威尔ITC-3200vf

测量过程中,智能追踪系统可根据被测轮廓斜率,实时动态调节 X 轴测量速度与 Z 轴位移量,确保在任意轮廓斜度下,X 轴测点间距均保持均匀一致。采集所得数据无需额外修正,即可直接满足数据处理算法对点云数据等间隔采集的规范要求。

View specifications & applications
APPLICATION CONSULTATION

Discuss instrument selection and quotations

Share the product, model, quantity and application requirements.

Contact Kemirui
Kemirui / APPLICATION INQUIRY

Let’s talk about your measurement.

Your information is used to respond to this inquiry.