显微镜解决方案 BX53-P
Specifications。A New Standard for Polarized Light Observation The BX53-P polarizing microscope provides superb performance in polarized light applications us...
- Thick Berek (U-CTB)
- 0–11000 nm (20λ) / Measurement of high retardation level (R*>3λ), (crystals, macromolecules,fi ber, etc.)
- Berek (U-CBE)
- 0–1640 nm (3λ) / Measurement of retardation level (crystals,macromolecules, living organisms, etc.)
- Senarmont Compensator (U-CSE)
- 0–546 nm (1λ) / Measurement of retardation level (crystals, living organisms, etc.); enhancement of image contrast (living organisms,etc.)
- Brace-Koehler Compensator1/10λ (U-CBR1)
- 0–55 nm (1/10λ) / Measurement of low retardation level (living organisms, etc.)